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机构地区:[1]西安工业学院光电工程学院,陕西西安710032
出 处:《激光与红外》2006年第8期699-702,共4页Laser & Infrared
摘 要:提出了一种新的波片快慢轴的确定方法,此方法是将待测波片置于起偏器和检偏器之间,通过旋转待测波片,对出射光的光强进行两组数据测量,就可以确定待测波片的某一光学主轴,再通过判断出射光的偏振态来确定该光学主轴是快轴还是慢轴。本方法对测量用的光源波长、光电探测器的线性、暗流及各向同性性均没有要求,可以确定出任何相延角波片的快慢轴,定轴精度可达±0.1°。In The paper a new method which can mark the placement of the fast or slow axis of wave plate is suggested. The measured wave plate is placed between polarizer and analyzer, and measures the intensity of the emergent light for two group data through revolving it, with that can mark one of the optics principal axises of the measured wave plate. Then, measuring the optics principal axis is the fast or slow axis through judging the state of polarization of the emergent light. The method have not any require to the wavelenghth of the lamp-house, and to the linearity, undercurrent, isotropy of the photoelectric detector. It can mark the placement of the fast or slow axis of the wave plate having any phase delay, the precision of marking the placement of the fast or slow axis is to be 0.1 degree.
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