激光微区发射光谱分析法测定硫氧化钇钐中的钐  

Determination of Sm in Long-Afterglow of the Y_2O_2S:Sm^(3+) Phospher Sample by LMESA

作　　者：周玉龙[1] 郝忠秀[1] 张云英[1] 郭庆林[1] 

机构地区：[1]河北大学物理科学与技术学院,河北保定071002

出　　处：《应用激光》2006年第3期195-197,共3页Applied Laser

基　　金：河北省自然科学基金(A2004000127);河北省教育厅(2003129)项目资助

摘　　要：本文以激光微区发射光谱分析仪和CCD光学多道分析仪组成分析系统,通过对样品多次采集和用数理统计法对数据进行处理,以SmII443.434nm为分析线,测定了Y2O2S:Sm3+长余辉材料中Sm的含量。分析结果表明:分析谱线相对强度RSD为5.01%,定量分析相对标准偏差RSD为8.96%,分析结果的平均值为2.018%;与制备前材料的百分含量比较,采用共沉淀法制备Y2O2S:Sm3+长余辉材料中Sm百分含量明显增大。This paper making SmⅡ443. 434nm as the analysis line, Sm in Long-Afterglow of the Y2O2S： Sm^3＋ phospher sample was determined by the equipment system composed of laser microemission spectral analysis equipment and CCD spectrograph. More data were collected and mathematic statistics was applied to analyzing data. It is shown that RSD of relative intensity of spectral line is 5.01% ;RSD of quantitative analysis is 8.96% ;the average of the quantitative analysis is 2. 018% ;comparing with the concentration before sample was synthesized, it can be concluded that the concentration of Sm in the Y2O2S：Sm^3＋ synthesized by the method of coprecipitation has an obvious increase.

关 键 词：激光微区发射光谱 定量分析 硫氧化钇钐 钐 

分 类 号：O657.34[理学—分析化学] TU991.21[理学—化学]