损伤对苹果电参数值的影响  

Influence of Damages on Electrical Parameter Values of Apples

作　　者：郭文川[1] 朱新华[1] 郭康权[1] 

机构地区：[1]西北农林科技大学机械与电子工程学院

出　　处：《农业机械学报》2006年第8期133-135,122,共4页Transactions of the Chinese Society for Agricultural Machinery

基　　金：西北农林科技大学校青年基金项目(项目编号:04ZM016);校博士科研启动项目

摘　　要：为了探索以电学特性识别损伤果品的方法,以富士苹果为对象进行了撞击和静压损伤对苹果电参数值影响的试验。结果表明,在苹果发生损伤后0.5h内,其相对介电常数和电阻率急剧变化,3h后趋于稳定,而同期无损苹果的相对介电常数和电阻率基本保持不变。储藏期间,撞击损伤苹果的相对介电常数持续增大并出现跃变;静压损伤苹果的相对介电常数迅速增大后保持不变,而无损苹果的相对介电常数一直保持增大趋势。Apples were used to find influence of bump and static press damages on electrical parameters in order to find a new method in identifying damaged fruits according to the electrical properties. Test results showed that relative dielectric constant εr＇, and resistivity ρ, of Fuji apples with bump damage or static press damage changed sharply within 0.5 h after damaged ,restored rapidly after 0.5 h and became stable during 3-12 h, and p of apples without damages kept constant in this period. During storage period,εr＇ of apples with bump damage changed abruptly in continuous increasing and that of apples with press damage increased rapidly in earlier storage period and kept constant in later period. Contrasted with damaged apples,εr＇ of undamaged apples increased continuously.

关 键 词：苹果 损伤 电参数 相对介电常数 电阻率 

分 类 号：S183[农业科学—农业基础科学] S661.1