DMD芯片在光栅投影三维轮廓测量技术中的应用  

Application of DMD in 3-D Profilometry Using Grating Projection

作　　者：陈坦[1] 赖建军[1] 赵悦[1] 

机构地区：[1]华中科技大学光电子工程系,湖北武汉430074

出　　处：《红外》2006年第9期24-28,共5页Infrared

基　　金：国防预研基金项目(编号:51401010104JW05)

摘　　要：光栅投影成像法经常用于物体的非接触形状测量和形变测量。通过莫尔相移法,可以实时获得物体表面的等高轮廓线。但是在测量高速运动物体三维轮廓图像时误差较大,因为相移法需要拍摄几张经过相移后的变形光栅。在加入了DMD芯片后,可以在CCD的一帧图像时间内完成所有的相移后变形光栅的图像拍摄,有效地降低了高速运动物体三维轮廓成像的误差。A grating projection imaging method is often used in non-contact shape and deformation measurement, By using moire topography, the equal-height or equal-displacement contour images of an object can be obtained in real time. However, more errors would be generated when the three dimensional （3 D） contour images of an object moving at a high speed are measured, because the phase-shifting moire method should capture several deformation grating images which have been phase-shifted. After a Digital Micro-mirror Device （DMD） is incorporated, the phase-shifting scanning moire method can obtain an equal-height or equal-displacement contour image within a frazne time, and hence effectively reduce the imaging error of the 3-D contour of the object which is moving at high speed.

关 键 词：光栅投影成像 莫尔相移法 数字微镜器件 三维物体成像 

分 类 号：TP274[自动化与计算机技术—检测技术与自动化装置]