FRS-XRSA表征双轴取向聚对苯二甲酸乙二酯薄膜的取向分布  

INVESTIGATION ON ORIENTATIONAL DISTRIBUTION OF BIAXIALLY ORIENTED PET BY FRS-XRSA

作　　者：吕文琦[1] 胡家璁[1] 

机构地区：[1]复旦大学高分子科学系

出　　处：《高分子学报》1996年第6期641-649,共9页Acta Polymerica Sinica

摘　　要：Ｘ－射线散射理论分析（ＦＲＳ－ＸＲＳＡ）是作者为了研究和表征取向高聚物结晶度与晶粒取向分布（ＯＤＣ）的一种新方案．在表征ＯＤＣ方面应用分峰法（ＣＰＲ）消除了传统极图法（ＰＦＭ）中高重叠峰相互干扰的困难，克服了取向分布函数分析（ＯＤＦＡ）中出现虚织构的困难，并且经一次系统的ＦＲＳ－ＸＲＳ测定，可以得到几乎所有主要（ｈｋｌ）晶面法向的ＯＤＣ．作者应用ＦＲＳ－ＸＲＳＡ对二类双轴取向ＰＥＴ磁带薄膜进行了ＯＤＣ的研究。基于结晶几何学原理（ＣＧＰ），建立了三斜晶系晶粒坐标系与试样坐标系的关系，并用于推演未测定方位角（αｉ，βｉ）（ｈｋｌ）的晶面散射以及未测（ｈ′ｋ′ｌ′）晶面的ＯＤＣ．作者关系建立了双轴取向函数〈ｃｏｓ２φｈｋｌ，ｉ〉，ｉ＝Ｎ、Ｍ、Ｔ的计算公式．按照ＦＲＳ－ＸＲＳＡ获得了反映取向分布的１０个晶面的双轴极图、三个主晶面（１００）、（０１０）、（１０５）的总极图，以及反映平均取向的各种取向函数，如〈ｃｏｓ２φｈｋｌ，ｉ〉、ｆｃｈｋｌ，ｉ等，结果十分令人满意．FRS-XRSA is a new procedure to study crystallinity and orientational distribution of crystallites (ODC) of various preferred orientation polymers. It eliminates the overlapping of multipeaks which occures in the traditional pole figure method (PFM) by CPR,overcomes the difficulty of ghost texture which appears in the orientational distribution function analysis (ODFA) because FRS-XRSA is a direct method,and can obtain ODC of almost all of the important (hkl) plane normals by one measurement sequence. In present paper,the ODC of two kinds of biaxially oriented PET magnetic films were studied. Based on the crystal geometry principle (CGP),the general relationship between crystallite-coordinate and sample-coordinate was set up and the ODC of unmeasured (h′k′l′) plane was deduced. And up the formula of biaxially orientational function<cos 2φ hkl,i >,i=N,M,T,also was set up .By FRS-XRSA,we obtained biaxial pole figures of ten(hkl) planes,pole figures of )three main planes(100)、(010)、( 1 05)and their orientation function<cos 2φ hkl,i >,f c hkl,i ,etc.The rdsults are very satisfactory.

关 键 词：FRS-XRSA 双轴取向 PET 双轴极图 高聚物 

分 类 号：O631.1[理学—高分子化学]