Ni/Y_2O_3/YSZ/CeO_2/YBCO高温超导膜的织构分析  

Texture Analysis of Ni/Y_2O_3/YSZ/CeO_2/YBCO High Temperature Superconducting Thin Film

作　　者：纪红[1] 王超群[1] 杨坚[1] 屈飞[1] 

机构地区：[1]北京有色金属研究总院测试所,北京100088

出　　处：《物理测试》2006年第5期1-4,共4页Physics Examination and Testing

基　　金：国家高技术研究发展计划(2004AA306130)

摘　　要：YBCO高温超导体有着广阔的应用前景,为改善其弱连接,通常要求强的c轴织构以提高临界电流密度值。通过RABiTS法可以在具有双轴织构的金属基底上外延生长出织构峰锐、组分单一的超导膜。为了减少晶格失配,通常需要在金属基体和超导层之间加入缓冲层。文章用2θ-θ扫描、扫描和ω扫描及极图法,对具有多层氧化物缓冲层的Ni/Y2O3/YSZ/CeO2/YBCO超导膜的织构进行了分析,表征了超导体由镍基带的立方织构{001}<100>经缓冲层的转动立方织构{001}<110>再到超导层的c轴织构的传递过程。YBCO superconductor has the most promising foreground in the worldwide. To decrease its weak link and improve critical current density, high quality c-axis texture is needed. The YBCO high temperature superconducting thin film can be grown by RABiTS technique. Intermediate buffer layer or multiplayer buffer structure is needed for decrease mismatched lattice. In this paper, X-ray diffraction θ-2θscan, φ scan, ω scan and polarogram are employed to characterize the texture of Ni/Y2O3/YSZ/CeO2/YBCO superconducting thin film. The pass process from {001 }〈100〉 cube texture on Ni substrate to c-axis texture on superconducting layer is expatiated.

关 键 词：织构 超导膜 极图 ω扫描 

分 类 号：TM26[一般工业技术—材料科学与工程] TB383.2[电气工程—电工理论与新技术]