用表面磁光克尔效应实验系统测量铁磁性薄膜的磁滞回线  

Magnetic hysteresis loop of the ferromagnetic film measured by using the test system of surface magneto-optic Kerr effect

作　　者：刘平安[1] 丁菲[1] 陈希江[2] 陆申龙[2] 

机构地区：[1]河南大学基础实验教学中心,河南开封475004 [2]复旦大学物理系,上海200433

出　　处：《物理实验》2006年第9期3-6,共4页Physics Experimentation

摘　　要：用自制的表面磁光克尔效应实验系统开发了研究性近代物理实验,测出铁磁性薄膜的磁滞回线,并求得克尔旋转角和克尔椭偏率.Using the test system of surface magneto-optic Kerr effect, a modern physics experiment is designed and developed with the purpose of the exploring study. The magnetic hysteresis loops of ferromagnetic films are plotted, and Kerr angle and Kerr ellipticity are measured.

关 键 词：表面磁光克尔效应 铁磁性薄膜 磁滞回线 克尔旋转角 克尔椭偏率 

分 类 号：O441.6[理学—电磁学]