低能离子辐照苏氨酸质量沉积方式的研究  

A Study of mass deposit pattern in threonine irradiated by low-energy ions

作　　者：黄卫东[1] 肖炳甲[1] 邵春林[1] 余增亮[1] 

机构地区：[1]中国科学院等离子体物理研究所,中国科学技术大学结构中心

出　　处：《核技术》1996年第12期746-749,共4页Nuclear Techniques

基　　金：国家自然科学基金;中国科学院青年科学基金

摘　　要：通过研究加入和不加入自由基清除剂条件下，３０ｋｅＶＮ＋辐照苏氨酸的剂量与氨基浓度的变化，提出入射的Ｎ＋是以氨基的形式沉积在样品分子中，定性和定量解释了低能离子辐射的剂量与氨基残存率的关系。加入自由基清除剂后剂量效应的变化分析结果表明，一部分入射离子是通过自由基反应历程沉积在样品分子中。The correlation between dose and amino group survival in 30keV nitrogen cation irradiation of threnine was studied under the condition of adding or not adding radical eliminator.It is assumed that an implanted nitrogen ion is deposited in the sample as an amino group and a mathematical correlation of the dose-survival is obtained,with which the experimental data can be satisfyingly explained.Some of the incident ions were found to be reacted with samples through radicals according to the analysis of experimental data.

关 键 词：苏氨酸 低能离子辐照 质量沉积效应 

分 类 号：Q517[生物学—生物化学] Q691