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作 者:王中俭[1] 姜波[1] 王景宇[2] 金招娣[1]
机构地区:[1]华东理工大学材料科学与工程学院,上海200237 [2]复旦大学信息科学与工程学院,上海200433
出 处:《玻璃与搪瓷》2006年第5期11-15,共5页Glass & Enamel
摘 要:研究了(0.4-x)PbO—xFe2O3—0.6P2O5半导体玻璃的电导性能。首先熔制了SF系列玻璃,测定了玻璃的氧化还原指数和电导率,并计算了铁离子浓度和铁离子的平均距离。讨论了玻璃组成、熔制条件以及氧化还原指数对电导的影响,揭示了它们的电导性质不仅与组成有关,而且与铁离子的氧化-还原状态有关。随着熔制温度的升高,氧化还原指数提高,从而使电导增加。研究表明,该半导体玻璃的电导机制符合Mott的小极化子跳跃理论。The paper has studied on electric conductivity of (0.4 -x)PbO-xFe2O3-0.6P2O5 semi - conducting glass. SF series glasses were firstly melted in an electric furnace. Redox number was measured by colorimetric method. Electric conductivity of the glass at different temperature was determined by micro - ampere meter. Concentration of iron ion and the average distance amongst ions were calculated. The present paper has discussed the influence of glass compositions, as well as the redox number and melting temperature on electric conductivity of the glasses. It is obvious that electric conductivity increases with increasing concentration of iron ion. However, the paper has revealed the fact that the electric property of the glass changes not only with the glass compositions, but also the equilibrium of oxidizing - reducing state of iron ion in the glass matrix. The redox number increases with the melting temperature, and then results in higher electric conductivity. The mechanism of the glass electic conductivity is well agreed with the Mott' s small polarons hopping (SPH) theory.
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