高非线性光子晶体光纤与单模光纤低损耗熔接实验  

Low Loss Splicing Experiment of High Nonlinearity Photonic Crystal Fiber and Single Mode Fiber

作　　者：张巍[1] 张磊[1] 陈实[1] 蔡青[2] 黄翊东[1] 彭江得[1] 

机构地区：[1]清华大学电子工程系,北京100084 [2]北京玻璃研究院,北京100062

出　　处：《中国激光》2006年第10期1389-1392,共4页Chinese Journal of Lasers

基　　金：国家973计划(2003CB314904);北京市自然科学基金(4042019)资助项目

摘　　要：在理论分析基础上,采用常规电弧放电熔接技术,在1550 nm波段对高非线性光子晶体光纤(PCF)与单模光纤(SMF)的熔接损耗机制进行了实验研究,指出模场失配是造成两者直接熔接损耗的主要因素;而熔接过程中因放电电流过大或放电时间过长所导致的光子晶体光纤的包层气孔形变以致塌陷,会引起超过10 dB的附加损耗。采用过渡光纤有效地缓解了两种光纤模场的失配;通过优化放电参数,有效地避免了光子晶体光纤包层气孔的塌陷,实现了高非线性光子晶体光纤和单模光纤的低损耗(<1 dB)熔接。Theoretical and experimental investigations on the splicing loss mechanism of high nonlinearity photonic crystal fiber （PCF） and single mode fiber （SMF） at 1550 nm point out that mismatching of the mode field of these two kind fibers is the main cause of the splicing loss, And the air hole collapse due to long fusion time and large fusion current results in a large additional loss over 10 dB, An intermediate fiber is used to achieve the mode field matching. And optimized parameters are used to avoid air hole collapse during the arc fusion splice. The total splicing loss can be reduced to 〈 1 dB.

关 键 词：光纤光学 光子晶体光纤 熔接损耗 模场失配 过渡光纤 

分 类 号：TN253[电子电信—物理电子学]