新化合物Al_(14)Gd_5Si的晶体结构及其Rietveld精修  

Crystal Structure and Rietveld Refinement of New Ternary Compound Al_(14)Gd_5 Si

作　　者：何维[1] 张吉亮[1] 曾令民[1] 

机构地区：[1]广西大学材料研究所,广西南宁530004

出　　处：《稀土》2006年第5期33-35,共3页Chinese Rare Earths

基　　金：广西自然科学基金资助项目(0575001);广西大学博士启动基金资助项目

摘　　要：利用X射线粉末衍射技术和R ietve ld结构修正方法对A l14G d5S i进行了研究,新三元化合物A l14G d5S i具有N i3Sn结构类型,空间群为P 63/mm c(N o.194)。点阵参数为a=0.63022(1)nm,c=0.45856(1)nm,指标化的可靠性因子F30=218.1(33)。用R ietve ld方法对该化合物的晶体结构成功地进行了精化修正,精修得到的R因子为Rp=0.119,Rwp=0.157。New ternary compound Al14Gd5Si has been studied by means of X-ray powder diffraction technique and Rieveld method. The ternary compound Al14Gd5Si has a Ni3Sn-type structure, space group P63/mmc （No. 194）, the lattice parameters a=0. 63022 （1）nm, c=0. 45856 （1）nm. The Smith and Snyder figure of merit for index, Fn,is F30= 218.1 （33）. The crystal structure of the compound Al14Gd5Si has been successfully refined by using Rietveld method from X-ray diffraction data. The R-factors of Rietveld refinement are Rp= 0. 119 and Rwp=0.157, respectively.

关 键 词：Al14Gd5Si 晶体结构 RIETVELD方法 

分 类 号：O766[理学—晶体学] O614.33