用于测量激光等离子体X射线的椭圆弯晶谱仪(英文)  

Elliptically bent crystal spectrometer for measuring laser-produced plasma X-ray

作　　者：熊先才[1] 钟先信[2] 肖沙里[2] 朱岗[2] 

机构地区：[1]重庆大学测量工程系,重庆400045 [2]重庆大学光电工程学院,重庆400044

出　　处：《光学精密工程》2006年第5期754-758,共5页Optics and Precision Engineering

基　　金：High-Technology Research and Development Program of China (No.863-804-3)

摘　　要：研制了一种椭圆弯晶谱仪用于测量0．44～0．81nm激光等离子体X射线光谱。该谱仪采用X射线CCD作探测器，用PET（2d=0．874nm）晶体作色散和聚焦元件，将晶体弯曲并粘贴在离心率和焦距分别为0．9586和1350mm的椭圆形不锈钢基底上。对该谱仪在“星光Ⅱ”激光装置上进行了打靶实验，实验结果表明其光谱分辨率接近1000。An elliptically bent crystal spectrometer has been designed and fabricated with an X-ray Charge Coupled Device （CCD） as the detector and a piece of PET（2d=0. 874 nm） crystal elliptically bent and fixed on a stainless steel suhstrate with an eccentricity of 0. 9586 and a focal length of 1350 mm is used as the dispersive and focusing element to measure 0. 44-0.81 nm X-ray spectra emitted from laserproduced plasmas. The experimental results obtained through application experiments performed at the XG-2 target chamber demonstrate that the spectral resolution of this spectrometer approximates 1000.

关 键 词：X射线谱仪 椭圆弯晶谱仪 光谱测量 激光等离子体 惯性约束聚变 

分 类 号：TH744.1[机械工程—光学工程]