A New Method for the Detections of Multiple Faults Using Binary Decision Diagrams  

作　　者：PAN Zhongliang CHEN Ling ZHANG Guangzhao 

机构地区：[1]School of Physics and Telecommunications Engineering, South China Normal University, Guangzhou 510631, Guangdong, China [2]Department of Electronics, Sun Yat-sen University, Guangzhou 510275, Guangdong, China

出　　处：《Wuhan University Journal of Natural Sciences》2006年第6期1943-1946,共4页武汉大学学报（自然科学英文版）

基　　金：Supported by the National Natural Science Foun-dation of China (60006002) ;Natural Science Research Project of Education Department of Guangdong Province of China (02019)

摘　　要：With the complexity of integrated circuits is continually increasing, a local defect in circuits may cause multiple faults. The behavior of a digital circuit with a multiple fault may significantly differ from that of a single fault. A new method for the detection of multiple faults in digital circuits is presented in this paper, the method is based on binary decision diagram （BDD）. First of all, the BDDs for the normal circuit and faulty circuit are built respectively. Secondly, a test BDD is obtained by the XOR operation of the BDDs corresponds to normal circuit and faulty circuit. In the test BDD, each input assignment that leads to the leaf node labeled 1 is a test vector of multiple faults. Therefore, the test set of multiple faults is generated by searching for the type of input assignments in the test BDD. Experimental results on some digital circuits show the feasibility of the approach presented in this paper.With the complexity of integrated circuits is continually increasing, a local defect in circuits may cause multiple faults. The behavior of a digital circuit with a multiple fault may significantly differ from that of a single fault. A new method for the detection of multiple faults in digital circuits is presented in this paper, the method is based on binary decision diagram （BDD）. First of all, the BDDs for the normal circuit and faulty circuit are built respectively. Secondly, a test BDD is obtained by the XOR operation of the BDDs corresponds to normal circuit and faulty circuit. In the test BDD, each input assignment that leads to the leaf node labeled 1 is a test vector of multiple faults. Therefore, the test set of multiple faults is generated by searching for the type of input assignments in the test BDD. Experimental results on some digital circuits show the feasibility of the approach presented in this paper.

关 键 词：digital circuits multiple faults fault detection binary decision diagrams 

分 类 号：TN407[电子电信—微电子学与固体电子学]