用当代飞行时间二次离子质谱分析航天器污染  

Spacecraft Contamination Characterization with Time-of-Flight Secondary Ion Mass Spectrometry

作　　者：黄雁华[1] 王光普[1] 陈旭[1] 周传良[2] 查良镇[1] 

机构地区：[1]清华大学电子工程系,北京100084 [2]北京卫星环境工程研究所,北京100094

出　　处：《真空科学与技术学报》2006年第5期348-352,共5页Chinese Journal of Vacuum Science and Technology

摘　　要：随着对航天器长寿命和高可靠性的要求日益提高,其污染问题已引起国内外高度重视。在监测污染物总量的基础上,需要有效的分析手段确定污染物的化学成分才能判断污染源。用当代飞行时间二次离子质谱仪器(TOF-SIMS)对我国地面空间环境模拟污染的典型样品进行了探索性实验,结果表明:与国内外现有的检测手段相比,当代TOF-SIMS最适于样品量有限的航天污染物的成份分析;具有高质量分辨的TOF-SIMS,对航天污染物包含的所有元素、同位素和化合物具有指纹鉴别能力;成像分析可解析出污染物形成历史的一些相关信息。TOF-SIMS有望在航天污染系统工程中发展成为一种独具特色的航天污染检测新技术。The feasibility of applying the state-of-the-art time-of-flight secondary ion mass spectrometry （TOF-SIMS） to characterization of space contamination was tentatively discussed with some preliminary results for the typical samples provided by Chinese aerospace simulation system on ground. Various advantages of TOF-SIMS over the existing conventional techniques include its unique fingerprint identification ability to detect spacecraft contaminations, such as elements, isotopes and compounds because of its ultrahigh mass resolution. In addition, some hidden information, including different contaminants and its formation history, can be derived with secondary ion images.

关 键 词：飞行时间二次离子质谱 航天器污染 地面空间环境模拟 成像分析 

分 类 号：O484[理学—固体物理] Q1[理学—物理]