阵列感应测井仪刻度系数特性研究  

A Study of Calibration Coefficient Characteristics of Array Induction Logging Tool

作　　者：仵杰[1] 刘春雅[1] 张甜甜[1] 王晓鹏[1] 

机构地区：[1]西安石油大学,陕西西安710065

出　　处：《测井技术》2006年第5期400-403,共4页Well Logging Technology

摘　　要：刻度系数是阵列感应测井仪器的关键参数。在阵列感应测井刻度理论基础上,导出刻度系数计算公式,计算分析了短、中和长3个子阵列的刻度系数随刻度环半径及其在仪器轴向上所处位置的变化特性。结果表明,不同子阵列的特性差异较大,尤其是长子阵列,并用各子阵列的二维几何因子解释了其产生的原因。讨论了刻度环大小选择、最佳刻度点和刻度电阻确定问题。这些研究结果可用于阵列感应测井仪器刻度中。Calibration coefficient is a group of key parameters of an array induction logging tool. Based on calibration theory of array induction logging, the calibration coefficient is derived. Computed and analyzed are the characteristics changing in calibration coefficient with altered radius and axial location of calibration loop for the short, middle and long spacing subarrays. The results show that different subarray has different characteristics, especially the longest one, and can be explained by two dimension geometrical factor. In addition, the selection of the radius and optimal location of the loop and calibration resistance are discussed. These results can be applied to the calibration of array induction logging tool.

关 键 词：阵列感应测井 刻度系数 刻度环 几何因子 

分 类 号：P631.32[天文地球—地质矿产勘探]