狭缝法测量X射线斑点大小  

Slit X-ray spot size measurement technique

作　　者：李勤[1] 石金水[1] 禹海军[1] 王莉萍[1] 何晖 

机构地区：[1]中国工程物理研究院流体物理研究所,四川绵阳621900

出　　处：《强激光与粒子束》2006年第10期1691-1694,共4页High Power Laser and Particle Beams

摘　　要：应用狭缝光阑成像法测量X射线斑点大小,通过狭缝成像获得光源的线扩展函数和调制传递函数MTF,而后从MTF为0.5所对应的空间频率之值确定出光源的光斑大小。应用该方法测量得到12 MeV直线感应加速器(LIA)X射线斑点大小为3.2 mm,及磁透镜在不同焦距下的X射线斑点大小。该项测量为12MeV LIA电子束聚焦调试实验提供有效判据。The high intense electron beam interacts with a high Z target, producing the X-rays for flash radiography. The focal spot size of the X-ray source is a critical parameter which degrades resolution in the flash radiography. This paper describes a slit which is used to measure the focal spot size. The X-ray spot image is obtained through the slit. The line spread function （LSF） and modulation transfer function（MTF） of X-ray spot are obtained from the slit image data, and the X-ray spot size is determined by the MTF. The measured X-ray spot size of the 12 MeV linear induction accelerator（LIA） is 3.2 mm. Different focal lengths are used, and the relevant X-ray spots size is measured for tuning the accelerator.

关 键 词：X射线 斑点 调制传递函数 狭缝光阑 

分 类 号：TN249[电子电信—物理电子学]