乙二酸基体对元素ICP-MS行为的影响  

The Effects Different Concentration of Oxalic Acid Matrix in ICP-MS

作　　者：聂西度[1] 何晓梅[1] 谢华林[1] 李玉杰[2] 

机构地区：[1]湖南工学院化工系,衡阳421008 [2]中南大学化学化工学院应化系,长沙410083

出　　处：《武汉理工大学学报》2006年第11期76-78,共3页Journal of Wuhan University of Technology

基　　金：湖南省自然科学基金(05JJ40017);湖南省教育厅优秀青年科研资助项目(05B064))

摘　　要：研究了不同浓度乙二酸介质对元素电感耦合等离子体质谱（ICP-MS）行为的影响。结果表明，随着雾化气流速的调节，低浓度乙二酸介质对所分析元素具有增敏效应，尤其是对电离电位在9～11eV的Be、Zn、Se、As、Sb、Hg等高电离电位元素。作为一种增敏剂，乙二酸可以补偿高电离电位元素因为无机基体存在所产生的信号抑制现象，从而改善其分析灵敏度。利用乙二酸对Be、Zn、Se、As、Sb、Hg等的增强特性，测定了水标准物质SRM 1640中的Be、Zn、Se、As、Sb和SRM 1641d中Hg，其测定结果与标准样品提供的标准值基本一致。The influence of different concentration of oxalic acid matrix on elemental inductively coupled plasma mass spectrometry （ICP-MS） was investigated. It was proved that the sensitivity of analytes could be significantly enhanced by adding small amounts of oxalic acid medium with adjusted nebulizer flow-rate gas, especially for the dements with ionization potential between 9 and 11 eV. Oxalic acid, as an enhancement agent, can be used to compensate the signal depression caused by inorganic matrix and to improve the detection limits about 2-10 times, for the hard-to-ionize elements in ICP-MS determination. The method was used to determine Be, Zn, Se, As, Sb and Hg in water standard reference materials （SRM）. The analytical results were very close to the certified values.

关 键 词：电感耦合等离子体质谱 乙二酸 增强效应 高电离电位元素 

分 类 号：TQ225.24[化学工程—有机化工]