Photoluminescence Properties of Two-dimensional Planar Layer and Three-dimensional Island Layer for ZnO Films Grown Using MOCVD  

Photoluminescence Properties of Two-dimensional Planar Layer and Three-dimensional Island Layer for ZnO Films Grown Using MOCVD

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作  者:HUANG Ke-ke HOU Chang-min GAO Zhong-min LI Xiang-shan FENG Shou-hua ZHANG Yuan-tao ZHU Hui-chao DU Guo-tong 

机构地区:[1]State Key Laboratory of Inorganic Synthesis and Preparative Chemistry [2]Department of Electronic Science and Engineering, Jilin University, Changchun 130012, P. R. China

出  处:《Chemical Research in Chinese Universities》2006年第6期692-695,共4页高等学校化学研究(英文版)

基  金:Supported by the National Natural Science Foundation of China(Nos. 20071013 and 20301007).

摘  要:ZnO(002) films with different thicknesses ranging from 7 to 300 nm were grown on sapphire(006) substrates via metal-organic chemical vapor deposition (MOCVD). The two-dimensional(2D) planar layer and the three-dimensional(3D) island layer were studied by using of X-ray diffraction(XRD) rocking curves and atomic force microscopy (AFM). The room temperature photoluminescence (PL) spectra show a blue shift of the peak positions of the uhraviolet(UV) emission with increasing film thickness. The blue shift is remarkably high(393-380 nm) when an increase in film thickness(7-15 nm) is accompanied by the change of structure from a 2D planar layer to a 3D island layer. The PL spectra at 77 K also indicate that there are different transition mechanisms in the film thickness from a 2D planar layer to a 3D island layer near the 2D layer region.ZnO(002) films with different thicknesses ranging from 7 to 300 nm were grown on sapphire(006) substrates via metal-organic chemical vapor deposition (MOCVD). The two-dimensional(2D) planar layer and the three-dimensional(3D) island layer were studied by using of X-ray diffraction(XRD) rocking curves and atomic force microscopy (AFM). The room temperature photoluminescence (PL) spectra show a blue shift of the peak positions of the uhraviolet(UV) emission with increasing film thickness. The blue shift is remarkably high(393-380 nm) when an increase in film thickness(7-15 nm) is accompanied by the change of structure from a 2D planar layer to a 3D island layer. The PL spectra at 77 K also indicate that there are different transition mechanisms in the film thickness from a 2D planar layer to a 3D island layer near the 2D layer region.

关 键 词:ZnO films Metal-organic chemical vapor deposition(MOCVD) PHOTOLUMINESCENCE Planar layer Island layer 

分 类 号:TN304.23[电子电信—物理电子学]

 

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