手机用TFT-LCD驱动控制芯片的测试电路结构设计  

The Architecture Design of Test Circuits of the TFT-LCD Driver IC Used for Mobile Phone

作　　者：李博[1] 魏廷存[1] 樊晓桠[1] 

机构地区：[1]西北工业大学航空微电子中心,陕西西安710072

出　　处：《微电子学与计算机》2006年第12期125-128,共4页Microelectronics & Computer

基　　金：国家863计划项目(2005AA121193);陕西省2004年科学技术研究发展计划项目(2004K05-G3)

摘　　要：文章从分析手机用TFT-LCD驱动控制芯片的测试需求和芯片结构出发,提出了一种针对该芯片的测试电路结构设计方案。该方案采用多条扫描链对芯片内的多个异构的模块进行隔离,保证了各个模块有较高的测试独立性。考虑到内置SRAM的特殊性,采用边界扫描方式进行测试,提高了测试的灵活性,减少了测试电路的面积。电平敏化扫描链的引入,大大提高了SourceDriver测试的可控制性。该方案支持手机用TFT-LCD驱动控制芯片的常规以及特殊项目的测试。In this paper, the test requirement and architecture of the TFT-LCD driver IC used for mobile phone are analyzed, and a design method of test circuits for this kind of driver IC is proposed. Multi scan path method is used for realizing the independent test of all circuit blocks, and the BSD method is used for the test of built-in SRAM with special architecture, which improved the flexibility of test and reduced the chip size of test circuits. The LSSD method is used for source driver test that is easy to control. The design method proposed in this paper can support normal and special tests of TFT-LCD driver IC very well.

关 键 词：测试电路 TFT—LCD驱动芯片 混合信号电路测试 

分 类 号：TP303[自动化与计算机技术—计算机系统结构]