基于单片机的光栅测试系统的硬件设计和实现  

Hardware Design and Implementation of Grating Testing System Based on Singlechip

作　　者：郭军团[1] 高有行[2] 范惠敏[1] 卢颖[1] 

机构地区：[1]西安工业大学计算机科学与工程学院,西安710032 [2]西安电子科技大学

出　　处：《西安工业大学学报》2006年第5期423-426,442,共5页Journal of Xi’an Technological University

摘　　要：光栅移动经过光电传感器时产生两路相位相差90°的脉冲信号,根据这一原理,对这两路信号进行相位处理并进行比较,判断自行生产的光栅的质量.文章介绍了测试系统的设计,笔者制作出光栅自动测试系统.经测试达到光栅测试自动化的预期效果.系统以MCS-51单片机作为核心器件,使得系统结构简单、紧凑,并有良好的性能.Passing photoelectronic sensor,grating shitf produces two pulse signals with phase difference of 90°. According to this principle,the two produced signals are processed and the phases are compared to determine the quality of self-manufactured grating. The design of the test system is introduced and the system is build by the authors. Expected function to test grating automatically is achieved. With MCS-51 sigle-chip as kernel part, the structure of system is simple and compact and the system performs satisfactorily.

关 键 词：光栅 测试仪 单片机 步进电机 串口通信 

分 类 号：TP368.12[自动化与计算机技术—计算机系统结构]