热电元件性能测试系统的电路设计  

Circuit Design for Significance Test System of Thermo Element

作　　者：居滋培[1] 濮钰麒[1] 于林丽[1] 孟丽霞[1] 林燕凌[1] 王斌[1] 

机构地区：[1]上海理工大学电气工程学院,200031

出　　处：《仪表技术与传感器》2006年第12期52-55,共4页Instrument Technique and Sensor

摘　　要：由于材料不稳定，热电元件须由测试系统完成性能筛选。介绍的热电元件测试系统用0．01mm的激光小光斑，在4耐的元件表面进行400个点的扫描，将元件电信号输入计算机进行性能分析。该测试系统的第一个关键技术是：设计一个每步行程为0．005mm，扫描点距为0．1mm的二维扫描平台小住移精密控制电路。另一方面，元件输出信号极为微弱，只有1-100μVpp，必须有高增益的放大电路，将输出信号放大到后端AZD电路所能接受的范围（0～10V）内，并避免干扰造成信号失真，这是系统的另一关键技术。就上述2个技术问题作详细介绍和分析，成功地解决了上述问题，并经实际使用取得很好的效果。As for instable material, thermo elements have to significance fdtration by test system. Here it is significance test system of thenno element which scan by laser facular in 0.01 mm on the surface of 4 square mm with 400 points. Then signal inputs computer for significance test. In the first place, the first key technology of the test system is to design little stepping exact control circuit with 2 - demenaion scanning flat in 0.005mm every step,and in 0. 1 mm scanning point. On the other hand,output signal of element is small with 1 - 100 vpp It is necessary to have high gain amplifying circuit to amplify output signal to the scope between 0 - 10V, which A/D Circuit could be accepted, in order to avoid signal distortion by disturbance. The another key technology of the test system is mentioned above. Thesis described and analyzed in details about two technologies. And also, it is settled above questions, and achieved good effects in practical application.

关 键 词：热电元件 测试 系统 电路设计 

分 类 号：TP273[自动化与计算机技术—检测技术与自动化装置]