真空环境下电介质表面电阻率测试方法及其影响因素  

Measurement Method and Influence Factors of Surface Resistivity of Dielectric in Vacuum Environment

作　　者：张要强[1] 刘晓东[1] 马丽婵[1] 郑晓泉[1] 

机构地区：[1]西安交通大学电力设备电力绝缘国家重点实验室,西安710049

出　　处：《绝缘材料》2006年第6期55-58,共4页Insulating Materials

基　　金：国家自然科学基金资助(50577052)

摘　　要：真空环境下直接测量电介质表面电阻率难度较大、成本较高、时间较长。为解决这一难题,提出了用测量电介质体积电阻率代替真空环境下电介质的表面电阻率的替代测试法;并从理论推导和试验验证两方面分析该替代测试法的可行性;最后以纯环氧板试样为实验对象,测量并分析了其电阻率与环境湿度、环境温度及大气压强的关系。结果表明:该替代测试法是可行的,且电介质表面电阻率与其表面薄涂层体电阻率成正比,厚度成反比;电介质电阻率随着环境湿度、环境温度的增大而减小,随着大气压强变化而变化很小。In vacuum environment measuring directly surface resistivity of dielectric is more difficult, more costly and takes more time. To solve this problem, a substitution measurement method by measuring volume resistivity of dielectric instead of measuring surface resistivity of dielectric is presented, and its feasibility is analyzed by means of theory and experiment. Finally measure and analyzethe relationships between resistivity of epoxy resin board sample and environment humidity, environment temperature and atmosphere pressure. The results show that this substitution measurement method is feasible, surface resistivity of dielectric is directly proportional to volume resistivity of the thin coated layer and inversely proportional to thickness of the thin coated layer, and with environmental temperature and humidity increasing, resistivity of dielectric decreases, while resistivity of dielectric changes very little with atmosphere pressure varying.

关 键 词：表面电阻率 体积电阻率 替代测试法 影响因素 

分 类 号：TM28[一般工业技术—材料科学与工程] TM535.1[电气工程—电工理论与新技术]