Principle of diffraction enhanced imaging (DEI) and computed tomography based on DEI method  

作　　者：ZHU Pei-Ping HUANG Wan-Xia YUAN Qing-Xi YU Jian WANG Jun-Yue ZHENG Xin SHU Hang CHEN Bo LIU Yi-Jin LI En-Rong WU Zi-Yu 

机构地区：[1]Beijing Synchrotron Radiation Facility, Institute of High Energy Physics, Chinese Academy of Sciences, Beijing 100049, China [2]Electronic Institute of Dalian University of Technology, Dalian 116023, China

出　　处：《Nuclear Science and Techniques》2006年第6期342-353,共12页核技术（英文）

基　　金：Supported by the National Outstanding Youth Fund (10125523 to Z.Wu.);the Key Important Nano-Research Project (90206032);the Key Important Project of the National Natural Science Foundation of China (10490190,10490194); by Knowledge Innovation Fund of IHEP.

摘　　要：In the first part of this article a more general DEI equation was derived using simple concepts. Not only does the new DEI equation explain all the problems that can be done by the DEI equation proposed by Chapman, but also explains the problem that can not be explained with the old DEI equation, such as the noise background caused by the small angle scattering reflected by the analyzer. In the second part, a DEI-PI-CT formula has been proposed and the contour contrast caused by the extinction of refraction beam has been qualitatively explained, and then based on the work of Ando's group two formulae of refraction CT with DEI method has been proposed. Combining one refraction CT formula proposed by Dilmanian with the two refraction CT formulae proposed by us, the whole framework of CT algorithm can be made to reconstruct three components of the gradient of refractive index.In the first part of this article a more general DEI equation was derived using simple concepts. Not only does the new DEI equation explain all the problems that can be done by the DEI equation proposed by Chapman, but also explains the problem that cart not be explained with the old DEI equation, such as the noise background caused by the small angle scattering reflected by the analyzer. In the second part, a DEI-PI-CT formula has been proposed and the contour contrast caused by the extinction of refraction beam has been qualitatively explained, and then based on the work of Ando＇s group two formulae of refraction CT with DEI method has been proposed. Combining one refraction CT formula proposed by Dilmanian with the two refraction CT formulae proposed by us, the whole framework of CT algorithm can be made to reconstruct three components of the gradient of refractive index.

关 键 词：衍射放大成像 X线断层摄影术 DEI法 辐射探测技术 

分 类 号：TL81[核科学技术—核技术及应用]