用表面磁光克尔效应测量材料表面磁特性的研究  

Measuring Surface Magnetism by Surface Magneto-Optic Kerr Effect

作　　者：江影[1] 邹红玉[2] 

机构地区：[1]中国计量学院理学院实验中心,浙江杭州310018 [2]浙江林学院理学院信息物理系,浙江临安311300

出　　处：《辽宁师范大学学报（自然科学版）》2006年第4期433-435,共3页Journal of Liaoning Normal University:Natural Science Edition

摘　　要：用表面磁光克尔效应测量铁磁材料的磁滞回线,并求得在饱和状态下的克尔旋转角.对于很多磁性薄膜,易磁轴方向为纵向,通常纵向克尔效应较明显.用自制装置可研究磁性材料表面的磁性质,现此实验已在近代物理实验中应用.Hysteresis loop of ferromagnetic materials are measured by using surface magneto-optic Kerr effect, and the Kerr rotation angle is obtained. For magnetic thin films, the magnetic axis is in the longitudinal direction, where Kerr effect is obvious. The magnetism of the ferromagnetic materials＇ surface may be studied by using the self-made installation and it has been applied to modern physics experiments.

关 键 词：克尔效应 磁滞回线 磁感应强度 

分 类 号：O482.5[理学—固体物理]