薄膜材料的非线性折射率和非线性吸收系数研究  

Study on the Nonlinear Refractive Index and the Nonlinear Absorption Coefficient of Thin Films

作　　者：王伟田[1] 王艳敏[1] 王燕[1] 孙玉明[1] 戴振宏[1] 

机构地区：[1]烟台大学光电信息科学技术学院,山东烟台264005

出　　处：《烟台大学学报（自然科学与工程版）》2007年第1期5-8,共4页Journal of Yantai University(Natural Science and Engineering Edition)

基　　金：国家自然科学基金资助项目(10404022)

摘　　要：介绍了用单光束纵向扫描技术(Z扫描)测量薄膜材料的三阶非线性光学效应方法,研究了薄膜材料的非线性吸收效应对其非线性折射率测量的影响.当非线性吸收和非线性折射共存时,非线性吸收效应使Z扫描闭孔的测量曲线峰谷不对称。Abstract： A single beam Z-scan method is introduced to analyze the nonlinear refractive index and the nonlinear absorption coefficient of thin films. The effects of nonlinear absorption on the measurement of nonlinear refractive index are investigated. The results show that when the nonlinear absorption and nonlinear refraction coexist, the symmetry of peak-valley curve of closed-aperture Z-scan measurement will be destroyed, and the peak,valley character will disappear completely withB/2kn2.

关 键 词：非线性折射率 非线性吸收 Z扫描 

分 类 号：O437[机械工程—光学工程]