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机构地区:[1]Structure Research Laboratory, Chinese Academy of Sciences, Hefei 230026, China,Physics Department, University of Science and Technology of China, Hefei 230026,China [2]Department of Physics, Zhejiang Normal University, Jinhua 321004,China [3]Physics Department,University of Science and Technology of China, Hefei 230026,China
出 处:《Journal of Rare Earths》2006年第6期745-748,共4页稀土学报(英文版)
基 金:Project supported by the National High Technology Research and Development Programof China(863 Program) (2002 AA324070) and the National Natural Science Foundation of China (50332050)
摘 要:Lu3Al5O12(LuAG) thin films with different Tb^3+ concentration were prepared on carefully cleaned (111 ) silicon wafer by a Peehini process and dip-coating technique. Heat treatment was performed in the temperature range from 800 to 1100 ℃. The crystal structure was analyzed by XRD. The results show that LuAG film starts to crystallize at about 900 ℃, and the particle size increases with the sintering temperature. Excitation and emission spectra of Tb^3+ doped LuAG films were measured. The effects of heat-treatment temperature and doping concentration of Th3 + on the luminescent properties were also investigated. For a comparison study, Th^3+-doped LuAG powders were also prepared by the same sol-gel method.Lu3Al5O12(LuAG) thin films with different Tb^3+ concentration were prepared on carefully cleaned (111 ) silicon wafer by a Peehini process and dip-coating technique. Heat treatment was performed in the temperature range from 800 to 1100 ℃. The crystal structure was analyzed by XRD. The results show that LuAG film starts to crystallize at about 900 ℃, and the particle size increases with the sintering temperature. Excitation and emission spectra of Tb^3+ doped LuAG films were measured. The effects of heat-treatment temperature and doping concentration of Th3 + on the luminescent properties were also investigated. For a comparison study, Th^3+-doped LuAG powders were also prepared by the same sol-gel method.
关 键 词:SOL-GEL LUAG luminescence properties thin film concentration dependence rare earths
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