尖端导体表面附近的电场特性  

Study on Electrostatic Field Near by the Sharp-point Conductor Surface

作　　者：刘定兴[1] 胡先权[1] 周天润[1] 

机构地区：[1]重庆师范大学物理学与信息技术学院,重庆400047

出　　处：《重庆师范大学学报（自然科学版）》2007年第1期56-58,共3页Journal of Chongqing Normal University:Natural Science

基　　金：重庆市科委自然科学基金项目(2005BB8267)

摘　　要：以圆锥形导体为研究对象,从求拉普拉斯方程在边界条件下的解出发,得到尖端导体附近的电势分布和等势线方程。利用场强与电势的关系,导出尖端导体表面附近电场强度的数学表达式及其表面面电荷密度。用计算工具软件M athem atica作出相应的等势线簇图形。According to the theories of mathematics and physics, the research into the electrostatic field near by the sharppoint conductor surface has been proceeded. The electrical potential distribution and the equation of equipotential line are given, Making use of the relationship of electrical field intensity and the electrical potential, duduce the mathematic expression of electrical field intensity and superficial charge density has been deduced, making use of the software package facility of Mathematica 5. 0, equipotential line maps is plotted.

关 键 词：尖端导体 电势 电场强度 等势线 等势线簇 

分 类 号：O441.1[理学—电磁学]