X射线安检系统的图像非均匀性校正方法  

Realization of Nonuniformity Correction of Image in the X-ray Security Inspection System

作　　者：伍玉苹[1] 史小军[1] 朱为[1] 堵国樑[1] 

机构地区：[1]东南大学电子科学与工程学院电路与系统,江苏省南京市210096

出　　处：《电子工程师》2007年第1期41-43,51,共4页Electronic Engineer

摘　　要：首先分析了X射线安检系统应用中图像非均匀性的原因,并在此基础上提出了一种新的软硬件结合的校正方法。此方法根据线性校正算法给每个探测单元以相应的校正参数,然后通过增益控制电路和零点补偿电路来调整最终的输出。实验结果表明,经过软硬件校正后图像水平条纹基本消失,图像效果明显改善。Based on the nonuniformity analysis of image in the X-Ray security inspection system, a novel correction method using both software correction and hardware correction is proposed. Correction parameters corresponding to each individual detector are computed by linear correction algorithm. Then the gain control circuit and the offset compensation circuit adjust the final output. Experimental results show that the horizontal texture of image are eliminated after the correction, and the image is improved significantly.

关 键 词：线阵列探测器 X射线安检系统 非均匀性校正 图像处理 

分 类 号：TN911.73[电子电信—通信与信息系统]