双介质谐振器法测量超导薄膜的表面电阻  

MEASUREMENT OF THE SURFACE RESISTANCE OF HTS FILMS BY TWO DIELECTRIC RESONATORS METHOD

作　　者：刘润宝[1] 魏斌[1] 彭慧丽[1] 李宏成[1] 曹必松[1] 

机构地区：[1]清华大学物理系,北京100084

出　　处：《低温物理学报》2007年第1期77-80,共4页Low Temperature Physical Letters

摘　　要：介绍了清华大学物理系研制的一个测量高温超导薄膜微波表面电阻的系统,展示了测量的原理和过程.本系统是按照目前国际上高温超导薄膜的微波表面电阻的测量标准方案(ICE/TC90)选定的TE011-TE013双介质谐振器法来对超导薄膜进行测量.介质谐振器谐振的中心频率约为11.96GHz,具有很高的准确性和灵敏度.在液氮(77K)温度下,用物理所提供的两片YBCO薄膜测量,TE011和TE013模式的无载Q值分别达到5.57×105和1.51×106,就我们所知,这是国内所报道的最高Q值.其Rs(77K,10GHz)平均值为263微欧.因此,本系统可以较为准确地测量表面电阻很小(300微欧以下)的高温超导薄膜.This paper introduce a system, which was made by physics department of Tsinghua university, for measuring the surface resistant （ Rs ） of the high temperature superconductor （HTS） films in microwave frequency, and show the principle and process of this measurement. This system use TE011 - TE013 two dielectric resonates method, which was proposed by ICE/TC90, to measure the R, of HTS films. The center resonant frequency of the system with high sensitivity and accuracy is about 11.96 GHz. When measuring two pieces of HTS films supplied by The Institute of Physics, Chinese Academy of Sciences, we got rather high unload Q values that value of TE011 and TE013 modes are 5.57 × 10^5 and 1.51 × 10^6 respectively, which were the highest Q value was reported in China as we know, so this system could measure the R, of HTS film accurately, even if the R, of the film is rather small （smaller than 300 microhm）.

关 键 词：介质谐振器 高温超导薄膜 表面电阻 品质因素 双介质谐振器法 

分 类 号：O511[理学—低温物理]