1310nm LD组件高低温循环寿命研究  

Research on high-low temperature cycle lifetime of 1310nm LDs modules

作　　者：左昉[1] 苏美开[2] 武金刚[1] 

机构地区：[1]北京科技大学信息工程学院,北京100083 [2]北京理工大学光电工程系,北京100081

出　　处：《光学技术》2007年第1期77-78,82,共3页Optical Technique

摘　　要：研究了半导体激光二极管(LD)组件的使用寿命。模拟了在不同的环境条件下,对1310 nm LD组件进行了高低温循环寿命实验,建立了循环寿命的数学模型。结果表明:循环寿命与循环的温差、循环的速度成指数关系,通过测试LD组件在高温差、高循环速度条件下的循环寿命,外推器件正常工作条件下的循环寿命。得到了LD组件可靠性数据,为工艺设计人员提出量化数据。Lifetime of semiconductor laser diode （LD） module was researched. High-low temperature cycle lifetime of 1310 nm LD modules was studied by experiment under different simulation environmental conditions. A mathematical model of the cycle lifetime of laser diode was established. The result shows that cycle lifetime has index relation to the temperature difference of cycle and cycle speed. By testing the cycle lifetime of LDs under the high temperature difference and high cycle rate conditions, the cycle lifetime of LDs under the ordinary working conditions can be estimated. Reliability data of LD module is obtained. Quantity data is provided for technique designer.

关 键 词：半导体激光器组件 高低温循环寿命 寿命数学模型 

分 类 号：TN312.8[电子电信—物理电子学]