高功率超短脉冲钛宝石激光系统波前测量实验  

Wavefront distortion measurement in high power ultra-short pulse Ti∶sapphire laser system

作　　者：刘兰琴[1] 朱启华[1] 周凯南[1] 王晓东[1] 黄小军[1] 彭翰生[1] KUDRYASHOV A V ZAVALOVA V 

机构地区：[1]中国工程物理研究院激光聚变研究中心,绵阳621900 [2]俄罗斯科学院激光和信息技术研究所,莫斯科140700

出　　处：《激光技术》2007年第1期95-97,共3页Laser Technology

摘　　要：为表征SILEX-Ⅰ超强超短脉冲钛宝石激光装置的性能,利用高空间分辨的哈特曼波前传感器实验研究了该系统的光束波前畸变特性。实验中采用俄罗斯科学院激光和信息技术研究所研制的自缩束哈特曼波前测量系统,哈特曼波前传感器的最大入射口径可达95mm,测量精度为0.08μm。得到激光脉冲在压缩前的P-V值仅为0.13λ(λ=800nm),RMS值为0.02λ;压缩后P-V值为0.63,λRMS值为0.09λ,并对实验结果进行了分析和讨论。结果表明,该激光装置具有良好的光束质量,其主要波前畸变来源于压缩池。To characterize beam quality in high power SILEX- Ⅰ ultra-short pulse Ti： sapphire laser system,experiments on wavefront measurement are performed. Using Shack-Hartmann wavefront sensor manufactured by Institute of Laser and Information Technology of the Russian Academy of Science, experiments at different positions are completed. The results show that the beam quality of this facility is very good,the P-V is 0.13λ,the RMS is 0.02λ before the compressor,and the P-V is 0.63A,the RMS is 0.09λ after the compressor. The experimental results show that the system has good beam quality, and the wavefront aberration mainly come from the compressor.

关 键 词：激光技术 光束质量 波前测量 哈特曼波前传感器 高功率超短脉冲激光装置 

分 类 号：TN248.1[电子电信—物理电子学]