等离子体质谱法测定高纯氧化铥中痕量稀土杂质元素的研究  

Determination of 14 Trace Rare Earth Im-purities in High-Purity Thulium Oxide by ICP-MS

作　　者：张楠[1] 刘湘生[1] 蔡绍勤[1] 

机构地区：[1]北京有色金属研究总院

出　　处：《分析试验室》1996年第6期13-17,共5页Chinese Journal of Analysis Laboratory

摘　　要：本文提出了ＩＣＰ－ＭＳ内标补偿校正法直接测定５Ｎ～６Ｎ高纯氧化镁中１４种痕量稀土杂质的方法，研究了ＩＣＰ－ＭＳ测定的谱干扰和基体效应。考察了Ｒｈ、Ｇａ、Ｉｎ、Ｃｓ作为内标元素的补偿校正作用，选用Ｉｎ内标有效地消除氧化铬（ｇ／Ｌ）的基体效应。标准加入回收为９２～１０６％，ＲＳＤ（ｎ＝１１）＜１０％。方法简单，灵敏、快速，并用于高纯氧化铥提取工艺流程分析的５Ｎ～６Ｎ的产品检验。Amethod for thedetermination of 14 rareearth impurities in high-purity thulium oxideby ICP-MS is reported.Instrumental parame-ters and other actors whkhaHect analvtical re-sults are discussed. The matrix compensatorycorrections with Rh、Cs、In and Ga as internalstandards are studied. Indium is selected asthe internal standard to compensate for matrixsuppression effect and sensitivitv dirft. The de-tection limits for individual rare earth elementare 0. 013～0. 085 μg/L.The recovery is 92.0%～106% with a relatively standard devia-tion of 1.3%～6.1%, The method can beused for thedetermination of 14 trace RE im-purities in high-purity Tm_2O_3, with no sepera-hon or preconcentration procedures.

关 键 词：氧化铥 稀土 内标法 等离子 体质谱法 

分 类 号：O614.33[理学—无机化学] O657.6[理学—化学]