连续半导体激光器LIV特性测试系统的设计  

Design of Continuous Laser Diode LIV Characteristic Testing System

作　　者：范贤光[1] 孙和义[1] 唐文彦[1] 张春富[1] 李慧鹏[1] 

机构地区：[1]哈尔滨工业大学自动化测试与控制系,黑龙江哈尔滨150001

出　　处：《激光与红外》2007年第2期166-169,共4页Laser & Infrared

摘　　要：针对通用的连续半导体激光器(LD)特性参数测试系统存在的问题,研制了一种新型的基于USB总线的连续半导体激光器LIV(light-current-voltage)特性测试系统。详细介绍了整个系统的硬件电路,包括半导体激光器的驱动单元、测试单元、基于FPGA的接口电路、单片机控制单元等,并对一DFB半导体激光器进行测试,给出了LIV曲线图。同时,对该系统的性能进行了分析。该系统已经应用于半导体激光器特性参数的自动测试,并取得了良好的效果。To solve the problem of the general laser diode characteristic testing system, a new continuous laser diode llght-current-voltage characteristic testing system based on USB bus is developed. The design of the whole hardware circuit, including the driver element, the measurement unit, the interface circuit based on FPGA, the SCM control unit, and so on, is introduced. A DFB laser diode is tested using the system, and the LIV curves are given. Meanwhile, the performance analyses are provided. The system has been applied to the test of the laser diode characteristic parameter, and the result is excellent.

关 键 词：半导体激光器 测试 FPGA USB总线 

分 类 号：TN248.4[电子电信—物理电子学]