单向单交叉并行链优先约束的可靠性系统测试优化  

Optimal sequential inspection of reliability systems subject to parallel-chain with single direction and single cross precedence constraints

作　　者：李岳[1] 崔利荣[1] 

机构地区：[1]北京理工大学管理与经济学院,北京100083

出　　处：《系统工程与电子技术》2007年第2期324-328,共5页Systems Engineering and Electronics

基　　金：国家自然科学基金(70371048);教育部新世纪优秀人才计划(NCET-05-08180J)资助课题

摘　　要：针对具有单向单交叉并行链优先约束的可靠性系统的最优测试序列问题,提出了一种最优测试原则,该测试原则的约束条件更接近复杂的实际情况。通过证明三个相关的定理,分别解决了单向单交叉并行链优先约束的问题转化形式,相交单元在最优测试序列中测试的先后顺序,以及反“Y”形优先约束问题的最优测试序列。利用这一测试原则,可使此类系统获得总期望测试成本最小。通过一系列证明,给出了该原则的求证过程及具体步骤。To study the optimal sequential inspection of the reliability systems which features some parallel-chain with single direction and single cross precedence constraints, an optimal inspection procedure is proposed to minimize the total expected inspection cost of reliability system subject to parallel-chain with single direction and single cross precedence constraints. The investigation process and algorithm are described.

关 键 词：可靠性 最优序列 优化测试 

分 类 号：O212[理学—概率论与数理统计]