化学电离质谱在大气痕量物种原位测量中的应用  

Application of Chemical Ionization Mass Spectrometry in in situ Measurement of Atmospheric Trace Species

作　　者：董璨[1] 侯可勇[1] 王俊德[1] 李海洋[1] 

机构地区：[1]中国科学院大连化学物理研究所

出　　处：《化学进展》2007年第2期377-384,共8页Progress in Chemistry

摘　　要：本文简要介绍了化学电离质谱的基本原理、仪器构成及特点,总结了化学电离质谱在大气痕量物种,如无机酸H2SO4、HNO3,自由基OH.、HO2.、RO2.,可挥发性有机物和气溶胶等的原位测量中取得的成果,最后对其未来的发展趋势作了展望。The fundamental principle and advantages of chemical ionization mass spectrometry （CIMS） are summarized. New progress of in situ measurement of transient species is reviewed in detail. Those species include inorganic acid, such as H2SO4, HNO3, free radicals, such as OH·, HO2·, RO2·, and volatile organic compounds. Furthermore, the developmental trend of CIMS is also discussed.

关 键 词：化学电离质谱 质子转移 痕量物种 原位测量 

分 类 号：O657.63[理学—分析化学] X502[理学—化学]