程序升温还原技术研究Sm_（2－x）Sr_xNiO_4  

Studies on Sm_(2-x)Sr_xNiO_4 by TPR

作　　者：楼辉[1] 葛玉平[1] 陈平[1] 唐寅轩[1] 马福泰[1] 

机构地区：[1]杭州大学化学系

出　　处：《杭州大学学报（自然科学版）》1996年第4期351-354,共4页Journal of Hangzhou University Natural Science Edition

基　　金：浙江省自然科学基金

摘　　要：本文用ＴＰＲ技术考察了Ｓｍ２－ｘＳｒｘＮｉＯ４的还原性能，探讨了Ｓｒ２＋取代对其结构及性能的影响．Ｓｍ２－ｘＳｒｘＮｉＯ４上有两个还原峰，低温还原峰的Ｔｍ值的变化趋势与Ｎｉ－ＯⅡ（／／ｃ－ａｘｉｓ）键长随ｘ的变化趋势相反，高温还原峰的Ｔｍ值的变化趋势与晶胞参数ｃ值的变化趋势相反．它们分别对应于不同结合态的氧的还原．K2NiF4 type compounds Sm2-xSrxNiO4 were prepared by citric acid method. The reducibility of the compounds was studied by temperature-programmed reduction (TPR). There are two reduction peaks in the TPR profile for each sample. The peak temperature at lower temperature,Tmax,l, increases as x increase, which is just opposite to the changes of Ni-OⅡ

关 键 词：程序升温还原 稀土复合氧化物 还原性能 

分 类 号：O614.33[理学—无机化学]