基于正交缺陷分类的软件过程测量方法  

SOFTWARE PROCESS MEASUREMENT BASED ON ORTHOGONAL DEFECT CLASSIFICATION

作　　者：袁东林[1] 

机构地区：[1]中国科学院研究生院,北京100039

出　　处：《计算机应用与软件》2007年第3期65-68,73,共5页Computer Applications and Software

摘　　要：软件过程是否有效,对评估软件产品的质量和提高组织的软件能力成熟度具有重要意义。正交缺陷分类(ODC)技术是一种对软件过程的有效性进行量化测量的方法。ODC技术基于对缺陷的分析,它依据一组正交的缺陷属性把缺陷归纳为不同的类别。这些互不相关的属性代表了缺陷的有效特征。软件产品的缺陷属性的统计分析,体现了对软件过程的测量结果,并将其反馈给开发团队。通过缺陷类型属性的应用实例,阐述了ODC技术的基本使用方法。It is very important to have the knowledge to evaluate the effectiveness of the software process in order to improve the software capability maturity level. ODC technology is a quantitative means of software process measurement based on defect analysis. ODC classifies the defects by a serial of orthogonal defect attributes which represent the significant signatures of a defect. As a process measurement result, the distribution of those defect attributes statistics provides the feedback to development team and organization so that the current processes shortage can be identified. This paper shows how the ODC works by illustrating the typical use of the Defect Type attribute.

关 键 词：正交缺陷分类 软件缺陷 缺陷类型 软件过程 软件过程测量 软件能力成熟度模型 

分 类 号：TP311.5[自动化与计算机技术—计算机软件与理论]