高纯钽的辉光放电质谱多元素分析  

Multi-element Analysis of High Purity Tantalum by Glow Discharge Mass Spectrometry

作　　者：陈刚[1] 葛爱景[1] 卓尚军[1] 王佩玲[1] 

机构地区：[1]中国科学院上海硅酸盐研究所,上海200050

出　　处：《质谱学报》2007年第1期36-39,共4页Journal of Chinese Mass Spectrometry Society

摘　　要：采用辉光放电质谱法（GD-MS）同时测定了高纯钽样品中76种元素，比较了两种不同构造放电池的影响。大多数元素的常规分析检测限在1～5ng·g^-1主要金属杂质含量与采用ICP-MS法定量分析的结果一致，这表明GD-MS对高纯钽样品无需标样的快速分析有较高的准确度。76 elements in high purity Tantalum were determined by glow discharge mass spectrometry （GD-MS）. The influence of two type of discharge cell was discussed. The LODs of most elements is 1～5 ng·g^-1. The concentrations of main metal impurities are in good agreement with those determined bY ICP-MS, which indicate the fast analysis of high purity Tantalum without standard by GD-MS promises to be accurate.

关 键 词：辉光放电质谱法(GD-MS) 多元素分析 钽 

分 类 号：O657.63[理学—分析化学]