乙二酸对电感耦合等离子体质谱的增强效应(英文)  

Enhancement effects of oxalic acid for inductively coupled plasma mass spectrometry

作　　者：谢华林[1] 何晓梅[1] 李玉杰[2] 

机构地区：[1]湖南工学院化工系,湖南衡阳421008 [2]中南大学化学化工学院应化系,湖南长沙410083

出　　处：《冶金分析》2007年第2期13-17,共5页Metallurgical Analysis

基　　金：Hunan provincial Natual Science Foundation(No.02JJY3007,03JJY5001)

摘　　要：研究了不同浓度下乙二酸对元素电感耦合等离子体质谱（ICP—MS）行为的影响。结果表明，低浓度乙二酸对所分析元素的灵敏度具有显著的增敏效应，尤其是对电离电位在9～11eV的Be，Zn，Se，As，Sb，Hg等高电离电位元素。作为一种增敏剂，乙二酸可以补偿由于无机基体的存在对高电离电位元素所产生的信号抑制现象，从而提高其分析灵敏度2～10倍。采用所建立的方法测定了水标准物质中的Be，Zn，Se，As，Sb和Hg，其测定结果与标准物质的认定值基本一致。The influence of different concentration of oxalic acid on elemental inductively coupled plasma mass spectrometry （ICP-MS） has been investigated. It has been proved that the sensitivity of analytes can be significantly enhanced by adding small amounts of oxalic acid, especially for the elements with ionization potential between 9 and 11 eV. Oxalis acid, as an enhancement agent, can be used to compensate the signal depression caused by inorganic matrix and to improve the detection limits by about 2-10 times, for the hard-to-ionize elements in ICP-MS determination. The method has been used to determine Be, Zn, Se, As, Sb and Hg in water certified reference materials. The analytical results are very close to the certified values.

关 键 词：电感耦合等离子体质谱 乙二酸 增敏效应 高电离电位元素 

分 类 号：O657.63[理学—分析化学]