Nd掺杂的Bi_4Ti_3O_(12)变温X射线衍射分析  

Dynamic High Temperature X-ray Diffraction Study of Nd-Doped Bi_4Ti_3O_(12) Ceramics

作　　者：徐文广[1] 李美亚[1] 李少珍[1] 

机构地区：[1]武汉大学物理科学与技术学院,湖北武汉430072

出　　处：《武汉大学学报（理学版）》2007年第1期81-84,共4页Journal of Wuhan University:Natural Science Edition

基　　金：湖北省自然科学基金(2004ABA082);教育部重点实验室基金资助项目

摘　　要：利用变温X射线衍射技术,在预烧过程中分析了Nd掺杂Bi4Ti3O12后生成Bi3.15Nd0.85Ti3O12(BNT)相的形成过程以及微结构的变化.实验观察到以30℃/min的升温速率,BNT相在700℃时开始形成,其衍射峰强度随温度的继续升高而增强,衍射峰半高宽随烧结时间延长而减小.X射线衍射分析结果表明,在900℃恒温条件下,烧结约2h,可形成单一的BNT相.During the presintering process, the crystal structure and phase transition of Nd-doped Bi4Ti3O12 have been studied by dynamic X-ray diffraction at varying high temperatures. And the observation shows that,with the temperature changing at the rate of 30 ℃/min,BNT phase begins formation at 700℃ ,the intensity of diffraction peak increases with increasing temperatures,while the half width of the diffraction peak decreases with the increasing time. The XRD result shows that,single BNT phase can be realized at 900℃ after sintering approximately 2 h.

关 键 词：铁电BNT 变温X射线衍射 结构相变 固态反应烧结 

分 类 号：O487[理学—固体物理]