Si-PIN硅条带探测器的电子学测试  

Test of Si-PIN strip detector by electronic method

作　　者：邹鸿[1] 陈鸿飞[1] 邹积清[1] 宁宝俊[2] 施伟红[1] 田大宇[2] 张录[2] 

机构地区：[1]北京大学空间物理与应用技术研究所 [2]北京大学微电子所北京,100871

出　　处：《核电子学与探测技术》2007年第2期170-173,共4页Nuclear Electronics & Detection Technology

基　　金：国家自然科学杰出青年基金资助(40425004)

摘　　要：采用电子学等效方法对所研制的Si-PIN条带探测器的基本性能进行测试。Si-PIN条带探测器是在一个硅基片上刻蚀多个条带探测器,常用于空间探测中的粒子方向测量。介绍了对Si-PIN条带探测器电子学等效测试方法和结果,重点探讨了条带之间的串扰问题。We have tested the basic performances of the Si-PIN strip detector, which developed by the Institute of Microelectronics of Peking University, with the electronic method. The Si-PIN strip detector is constructed as several strip detectors in one silicon slice, and can be generally used to measure the particle directions in the space exploration. This paper gives a detail description of the electronic test, and discusses the interfere between strips. For our sample, the amount of the cross-disturbance to a neighbour strip is 5.9 per cent. It depends on the gap between strips and the capacitance of the strips.

关 键 词：硅条带探测器 空间粒子探测 耗尽电容 条间串扰 

分 类 号：TL814[核科学技术—核技术及应用]