BESⅢ漂移室电子学时间测量电路的性能测试  

The performance testing of timing measurement of BESIII MDC electronics

作　　者：赵豫斌[1] 章红宇[1] 盛华义[1] 

机构地区：[1]中国科学院高能物理研究所,北京100049

出　　处：《核电子学与探测技术》2007年第2期240-242,共3页Nuclear Electronics & Detection Technology

摘　　要：阐述了BESⅢ漂移室电子学中时间测量电路的主要性能指标:时间分辨、微分非线性及积分非线性的测试方法及测试结果。This paper outlines the testing methods and the tested results for the performance of the timing measurement system in BESⅢ MDC electronics. The testing mainly includes the time resolution testing, time differential nonlinearity testing and time integral nonlinearity testing.

关 键 词：时间分辨 微分非线性 积分非线性 

分 类 号：TN78[电子电信—电路与系统]