BESⅢ读出系统测试与研发中的前端电子学模拟  

The simulation of the front end electronics system in BESⅢ readout system testing

作　　者：雷广坤[1] 王靓[1] 朱海涛[1] 初元萍[1] 朱科军[1] 赵京伟[1] 

机构地区：[1]中国科学院高能物理研究所

出　　处：《核电子学与探测技术》2007年第2期250-253,共4页Nuclear Electronics & Detection Technology

摘　　要：介绍了BESⅢ读出系统测试与研发中利用MVME2431单板计算机对前端电子学的模拟实现。叙述了BESⅢ前端电子学系统的功能及模拟其系统的目的;着重介绍模拟所采用的技术路线和实现办法,并对电子学模拟的整体性能进行了客观评估。This article introduces the method to simulate the front end electronics system In BESⅢ readout system testing by using MVME2431, which is an embeded single board computer. The Function of the front end electronics and the simulating purpose are described in the paper. In detail, the implementation and relevant arithmetic are discussed. Also the performance of the simulator is refered at the end of the presentation.

关 键 词：POWERPC VME BESⅢ 数据获取 读出系统 系统模拟 

分 类 号：TP39[自动化与计算机技术—计算机应用技术]