Characteristic Analysis of Diffraction from the Restricted Output End Surface of Single Mode Planar Waveguide  

作　　者：LI Lian-huang GUO Fu-yuan WANG Li-xiang HU Lin-shun 

机构地区：[1]Fujian Provincial Key Laboratory of Photonic Technology, Institute of Laser ＆ Optoelectronic Technology, Fujian Normal University, Fuzhou 350007, CHN [2]Department of Information Science ＆ Electronic Engineering, Zhejiang University, Hangzhou 310027, CHN

出　　处：《Semiconductor Photonics and Technology》2007年第1期83-88,共6页半导体光子学与技术（英文版）

基　　金：Natural Science Foundation of Fujian Province(A0540001);The Program of the Science and Technology Depart ment of Fujian Province(K04022)

摘　　要：As for single mode symmetric step refractive index structure dielectric planar optical waveguide, when its output end is restricted, the diffractive field distribution is derived. It can be expressed as the convolution between the Dirac function and the Sinc and Lorenz functions. It is helpful to deepen the recognition of the restricted diffraction. The characteristic of the diffractive field is discussed. The variational curve of the full angle width at half maximum intensity of central bright fringe versus the half width of slit is presented by numerical calculation, and the fitting curve with the exponential function is close to it.As for single mode symmetric step refractive index structure dielectric planar optical waveguide, when its output end is restricted, the diffractive field distribution is derived. It can be expressed as the convolution between the Dirac function and the Sinc and Lorenz functions. It is helpful to deepen the recognition of the restricted diffraction. The characteristic of the diffractive field is discussed. The variational curve of the full angle width at half maximum intensity of central bright fringe versus the half width of slit is presented by numerical calculation, and the fitting curve with the exponential function is close to it.

关 键 词：DIFFRACTION SLIT central bright fringe full angle width 

分 类 号：TN252[电子电信—物理电子学]