Microanalysis on the Hydrogen Ion Irradiated 50 wt pct TiC-C Films  

作　　者：Hui JIANG Yaoguang LIU Ningkang HUANG 

机构地区：[1]Key Laboratory for Radiation Physics and Technology of Education Ministry of China, Institute of Nuclear Science and Technology, Sichuan University, Chengdu 610064, China [2]Institute of Nuclear Physics and Chemistry, China Academy of Engineering Physics, Mianyang 621900, China

出　　处：《Journal of Materials Science & Technology》2007年第1期127-130,共4页材料科学技术（英文版）

摘　　要：The 50 wt pct TiC-C films were prepared on stainless steel substrates by using a technique of ion beam mixing. These films were irradiated by hydrogen ion beam with a dose of 1×10^18 ions/cm^2 and an energy of 5 keV. Microanalysis of X-ray photoelectron spectroscopy （XPS） and secondary ion mass spectroscopy （SIMS） were used to analyze the films before and after hydrogen ion irradiation and to study the mechanism of hydrogen resistance.The 50 wt pct TiC-C films were prepared on stainless steel substrates by using a technique of ion beam mixing. These films were irradiated by hydrogen ion beam with a dose of 1×10^18 ions/cm^2 and an energy of 5 keV. Microanalysis of X-ray photoelectron spectroscopy （XPS） and secondary ion mass spectroscopy （SIMS） were used to analyze the films before and after hydrogen ion irradiation and to study the mechanism of hydrogen resistance.

关 键 词：Titanium carbide Hydrogen ion irradiation MICROANALYSIS 

分 类 号：TG174.445[金属学及工艺—金属表面处理]