MnFeP_(0.6)Si_(0.25)Ge_(0.15)粉末样品的制备及X射线衍射分析  

Preparation and X-Ray Diffraction Analysis of MnFeP_(0.6)Si_(0.25)Ge_(0.15) Powder

作　　者：王高峰[1] 松林[1] 欧志强[1] 哈斯朝鲁[1] 呼努斯图[1] 李新文[1] 特古斯[1] 

机构地区：[1]内蒙古师范大学物理与电子信息学院磁性材料重点实验室,内蒙古呼和浩特010022

出　　处：《内蒙古师范大学学报（自然科学汉文版）》2007年第2期156-159,共4页Journal of Inner Mongolia Normal University(Natural Science Edition)

基　　金：国家自然科学基金资助项目(502610030);内蒙古自治区高等学校科学研究项目(NJ05101)

摘　　要：使用机械合成法制备了MnFeP0.6Si0.25Ge0.15粉末样品,研究了试样颗粒大小和半峰宽随球磨时间的变化关系.X射线粉末衍射分析表明,该样品退火后为Fe2P结构,样品密度ρ=6.655 g/cm3,颗粒大小D=43.2 nm,晶格畸变量Δd/d=0.053 818,表明在球磨过程中存在一定的晶格畸变.球磨100 h后,试样颗粒大小达到纳米量级.MnFeP0.6 Si0.25 Ge0.15 power was prepared by means of mechanical synthesis. Size of particulate and full width of it at half maximum change with milling time researched. XRD data indicated that the sample was Fe2P single phase after annealing. The density p= 6. 655 g/cm^3 , the size D= 43.2 nm and the lattice distortion Ad/d=0.053 818 of the sample which was heat treatment were calculated. It illuminated that there was some lattice distortion in the milling and the magnitude of sample reached nanograde after milled 100 hours.

关 键 词：化合物 X射线衍射 半峰宽 晶格畸变 可靠因子 MnFeP0.6Si0.25Ge0.15粉末 

分 类 号：O482.54[一般工业技术—材料科学与工程]