直流盘形悬式绝缘子离子迁移测试系统的研究  

Research on Ion Migration and the Measuring and Testing System of D.C.Suspension Insulators

作　　者：危鹏[1] 胡文岐[1] 刘志强[1] 朱海涛 张源斌[3] 

机构地区：[1]国家绝缘子避雷器质量监督检验中心,陕西西安710077 [2]甘肃省电力局,甘肃兰州730000 [3]西安交通大学,陕西西安710049

出　　处：《电瓷避雷器》2007年第2期12-15,共4页Insulators and Surge Arresters

摘　　要：对直流盘形悬式绝缘子离子迁移过程进行了分析,认为离子迁移微观上表现为绝缘子内部某些金属正离子和自由电子的定向迁移。直流绝缘子离子迁移试验测量系统采用51系列单片机及其保护系统,运用C++ Builder计算机语言设计了一套实用软件,实现了离子迁移试验的自动控制、测量及52路微电流、52路体电阻、累积电荷的在线监测和相应的数据处理,提高了直流绝缘子离子迁移试验的准确度和工作效率。The ion migration process of D.C. Disc suspension insulator is analyzed, which considers that the ion migration microscopically performs as the directional migration of some metal positive ions and free electrons in the insulators. For ion migration measuring ＆ testing of D.C. insulators, 51 series MCU together with its protection system was adopted, using C^＋＋ Builder computer language to design a set of practical programs, which achieves the automatic control of ion migration test, the measurement of 52-1oop micro-current and 52-1oop volume resistance, the online monitoring of accumulated charge and the corresponding data processing, which enhances the accuracy and working efficiency of ion migration test of D.C. Insulator.

关 键 词：直流悬式绝缘子 离子迁移 试验测量系统 51系列单片机 

分 类 号：TM216[一般工业技术—材料科学与工程]