表面活性剂增感原子吸收光谱法测定三氧化钨中微量钴、镍、铜  

Simultaneous Determination of Trace Cobalt,Nickel and Copper in Tungsten Oxied by Enhancing Effect of Surfactant-Atomic Absorption Spectrometry

作　　者：晋勇[1] 

机构地区：[1]机械电子工业部成都工具研究所,成都610056

出　　处：《分析化学》1990年第3期257-259,共3页Chinese Journal of Analytical Chemistry

摘　　要：本文提出了利用表面活性剂的增感作用原子吸收光谱法测定三氧化钨中微量钴、镍、铜的新方法。研究了阴离子表面活性剂十二烷基硫酸钠对钴、镍、铜的增感效果和消除基体钨的干扰的作用,探讨了其机理。拟定的方法用于样品分析时,得到了满的结果。The atomic absorption spectrometric conditions fot determining trace Co, Ni and Cu in tungsten oxide by enhancing effect of sodium dodecyl sulfate has been studied. A marked enhancement effect for the determination of Co, Ni and Cu in the sodium dodecyl sulfate system appears under certain conditions, and the interferences of large amounts of tungsten are eliminated. The mechanism of enhancement was discussed. The method was simple, rapid and accurate. The method has been applied to the simultaneous determination of trace Co, Ni and Cu in tungsten oxide with satisfactory results.

关 键 词：三氧化钨 钴 镍 铜 原子吸收法 

分 类 号：O614.613[理学—无机化学]