基本参数法在 X 射线荧光光谱分析地质样品中的应用  

Application of the Fundamental Parameter Method in Analysis of the Powder Geological Samples by X-Ray Fluorescence Spectrometry

作　　者：吉昂[1] 袁宁儿 

机构地区：[1]中国科学院上海硅酸盐所,上海200050

出　　处：《分析化学》1990年第11期1025-1028,共4页Chinese Journal of Analytical Chemistry

摘　　要：本文以地质标准样品为研究对象,用粉末压片方法考察了基本参数法和理论a系数对分析结果的影响,并就联机分析时的烧失项的处理、交叉系数的应用,校正曲线回归时的误差加权等对分析结果的影响进行了研究。The author used the powder geological chemical reference standard as a research objcct. The factqls (e. g. the ignition loss item, across ccefficients and weighting error in rcgression analysis) which effect on the analysis results have been studied with Fly-FPM, XRF 11 and X44 program attached to PW1404 X-ray fluorescence spectrometer respectiyely. When the components of samples are over the range of standards the result. obtained from Fly-FPM program is better than XRF11 program. The accuraey can be improved owing to use the across coefficients and weighting error in regression analysis.

关 键 词：基本参数法 X射线 荧光光谱 地样 

分 类 号：O657.34[理学—分析化学]