X射线荧光滤纸片法分析Y-Ba-Cu-O体系超导薄膜中Y/Cu、Ba/Cu的原子比  

The Detenninatioii of the Atomic Ratio for Y/Cu and Ba/Cu in a Superconductive Film by X-ray Fluorescence Spectrometry

作　　者：刘洋[1] 袁汉章[1] 秦颖 

机构地区：[1]北京有色金属研究总院,北京100088

出　　处：《分析试验室》1990年第3期34-37,45,共5页Chinese Journal of Analysis Laboratory

摘　　要：本文根据薄试样原理,用溶液滤纸片法制备标准样品,使用X射线荧光光谱法测定Y-Ba-Cu-O超导薄膜中Y/Cu、Ba/Cu原子比。研究了不同离子在滤纸片上的分布,并在此基础上确立了一套比较可靠的标准样品制备条件,适用于薄膜样品分析。A key problem in the determination of atomic ratio lies in the preparation of standard samples.A set of standard samples were experimentally prepared based on the principl of thin sample procedure. By using these standard samples the atomic ra.tio for Y/Cu and Ba/Cu in a superconductive film can be determined by X-ray fluorescence spectrometry. The method is reliable, rapid and easy to operate and given satisfactory results.

关 键 词：铊钡铜氧 超导膜 XRFA法 原子比 

分 类 号：TM262[一般工业技术—材料科学与工程]